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MAX9971, MAX9972
Quad, Ultra-Low-Power, 300Mbps ATE Drivers/Comparators

Low Cost, Low-Power ATE Pin Electronics for Memory, Burn-In, and Structural Automated Test Equipment


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Description
FULL DATA SHEET (PDF, 492kB)
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The MAX9971/MAX9972 four-channel, ultra-low-power, pin-electronics ICs include, for each channel, a three-level pin driver, a window comparator, a passive load, and force-and-sense Kelvin-switched parametric measurement unit (PMU) connections. The driver features a -2.2V to +5.2V voltage range, includes high-impedance and active-termination (3rd-level drive) modes, and is highly linear even at low voltage swings. The window comparator features 500MHz equivalent input bandwidth and programmable output voltage levels. The passive load provides pullup and pulldown voltages to the device-under-test (DUT).

Two grade versions are available, A grade and B grade. The A-grade version provides tight gain and offset matching for the driver and comparator, allowing reference levels to be shared across multiple channels. It also provides tighter tolerance of the load resistance values. The B-grade version is for system designs that incorporate independent reference levels for each channel.

Low-leakage, high-impedance, and terminate controls are operational configurations that are programmed through a 3-wire, low-voltage, CMOS-compatible serial interface. High-speed PMU switching is realized through dedicated digital control inputs.

These devices are available in an 80-pin, 12mm x 12mm body, 1.0mm pitch TQFP with an exposed 6mm x 6mm die pad on the bottom of the package (MAX9972), and the top of the package (MAX9971), for efficient heat removal. The MAX9971/MAX9972 are specified to operate over the 0°C to +70°C commercial temperature range, and feature a die temperature monitor output.

Key Features   Applications/Uses
  • Small Footprint—Four Channels in 0.3in2
  • Low Power Dissipation: 325mW/Channel Typical
  • High Speed: 300Mbps at 3VP-P
  • -2.2V to +5.2V Operating Range
  • Active Termination (3rd-Level Drive)
  • Integrated PMU Switches
  • Passive Load
  • Low-Leak Mode: 20nA max
  • Low Gain and Offset Error
  • Lead-Free Package Available

 
  • Active Burn-In Systems
  • DRAM Probe Testers
  • Low-Cost Mixed-Signal/System-on-Chip (SOC) Testers
  • NAND Flash Testers
  • Structural Testers

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    Document Ref.: 19-0474; Rev 0; 2006-07-18
    This page last modified: 2007-01-16



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