QuickView - DS2174 EBERT

Description

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The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2ⁿ - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.

Key Features

	Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems
	Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 2³² - 1; up to 32 taps can be used in the feedback path
	Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length
	Large 48-bit count and bit error count registers
	Software-programmable bit error insertion
	Fully independent transmit and receive paths
	8-bit parallel-control port
	Detects polynomial test patterns in the presence of bit error rates up to 10^-2
	Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces
	Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3
	Available in 44-pin PLCC