Reliability Monitor Program (Q2 2009)

See Process Reliability Report Index, by Product (PDF, 507kB) Stress Tests Preconditioning Operating Life Storage Life Temperature Cycle Temp Humidity Bias Write Cy/Data Ret'n Package Integrity Process Reliability Chartered 0.35µm Silicon Gate CMOS Dallas 0.35µm Silicon Gate CMOS (E35) Dallas 0.35µm "D" Silicon Gate CMOS (E35D) Dallas 0.6µm Silicon Gate CMOS (E6) Dallas 0.8µm Silicon Gate CMOS (B8) Epson 0.4µm Silicon Gate CMOS (S4) Epson 0.4µm Silicon Gate CMOS (S45) Epson 0.6µm Silicon Gate CMOS (C6Y) MFN Dual Poly NPN Bipolar (GST2) MFN 0.8µm Silicon Gate CMOS (B8) MFN 1.2µm Silicon Gate CMOS (B12) MFN 1.2µm Silicon Gate CMOS (S12) MFN 3.0µm Silicon Gate CMOS (B3) MFN 3.0µm Silicon Gate CMOS (S3) MFN 80V Bipolar CMOS DMOS (BCD80) MFN 250V Bipolar CMOS DMOS (BCD250) MFN SiGe HBT (F120) MFN Poly Emitter Complementary Bipolar (CB) MFN SiGe HBT 0.5µm CMOS (G4) MFN SiGe HBT 0.35µm BiCMOS (MB3) MFN SiGe HBT BiPolar (GST3) San Antonio 0.4µm Silicon Gate CMOS (S4) San Antonio 0.4µm Silicon Gate CMOS (S45) San Antonio 0.8µm Silicon Gate CMOS (B8) TSMC 0.18µm Silicon Gate CMOS TSMC 0.35µm Silicon Gate CMOS TSMC 0.5µm Silicon Gate CMOS UMC Poly Emitter Complementary Bipolar (CB) X3 0.18µm Silicon Gate CMOS (S18) X3 0.4µm Silicon Gate CMOS (S4) X3 0.4µm Silicon Gate CMOS (S45) X3 0.6µm Silicon Gate CMOS (B6) X3 0.6µm Silicon Gate CMOS (C6) X3 0.8µm Silicon Gate CMOS (B8) X3 SiGe HBT 0.35µm BiCMOS (MB3) Assembly Reliability CSBGA iButton LQFP PBGA PDIP PLCC QFN SOIC SOT SPM TO TSOC TSSOP µMAX See Process Reliability Report Index, by Product (PDF, 507kB)