Reliability Monitor Program (Q4 2008)

See Process Reliability Report Index, by Product (PDF, 507kB) Stress Tests Preconditioning Operating Life Storage Life Temperature Cycle Temp Humidity Bias Write Cy/Data Ret'n Package Integrity Process Reliability Chartered 0.35µm Silicon Gate CMOS DAL 0.35µm Silicon Gate CMOS DAL 0.35µm "D" Silicon Gate CMOS DAL 0.6µm Silicon Gate CMOS DAL 0.8µm Silicon Gate CMOS DAL 2.0µm Silicon Gate CMOS DAL B8 Silicon Gate CMOS Epson 0.4µm Silicon Gate CMOS Epson 0.6µm Silicon Gate CMOS MFN Dual Poly 0.8µm CMOS MFN Dual Poly NPN Bipolar MFN 1.2µm Silicon Gate CMOS MFN 1.2µm High Voltage BiCMOS MFN 3µm Silicon Gate CMOS MFN 5µm Silicon Gate CMOS MFN 80V Bipolar CMOS DMOS MFN 250V Bipolar CMOS DMOS MFN Poly Emitter Complementary Bipolar MFN SiGe HBT CMOS MFN SiGe HBT 0.5µm CMOS MFN SiGe HBT BiPolar MFN Standard Metal Gate CMOS San Antonio 0.4µm Silicon Gate CMOS San Antonio 0.8µm Silicon Gate CMOS San Antonio 0.8µm Silicon Gate CMOS w/memory X3 0.4µm Silicon Gate CMOS X3 0.6µm Silicon Gate CMOS X3 0.8µm Silicon Gate CMOS X3 SiGe HBT 0.35µm CMOS TSMC 0.18µm Silicon Gate CMOS TSMC 0.35µm Silicon Gate CMOS TSMC 0.5µm Silicon Gate CMOS Assembly Reliability BGA Module Cartridge CSBGA CSP Dongle Flip Chip iButton LGA LQFP Module MQFP PBGA PDIP PLCC Power Cap QFN QSOP SC70 SipStik SOIC SOT SPM SSOP TO TQFP TSOC TSSOP µMAX See Process Reliability Report Index, by Product (PDF, 507kB)