Reliability Monitor Program (Q4 2007)

See Process Reliability Report Index, by Product (PDF, 507kB) Stress Tests Preconditioning Operating Life Storage Life Temperature Cycle Temp Humidity Bias Write Cy/Data Ret'n Package Integrity Process Reliability Chartered 0.35µm Silicon Gate CMOS DAL 0.35µm Silicon Gate CMOS DAL 0.35µm "D" Silicon Gate CMOS DAL 0.6µm Silicon Gate CMOS DAL 0.8µm Silicon Gate CMOS DAL B8 Silicon Gate CMOS MFN Dual Poly 0.8µm CMOS MFN Dual Poly NPN Bipolar MFN 1.2µm Silicon Gate CMOS MFN 1.2µm High Voltage BiCMOS MFN 3µm Silicon Gate CMOS MFN 5µm Silicon Gate CMOS MFN 80V Bipolar CMOS DMOS MFN Poly Emitter Complementary Bipolar MFN SiGe HBT CMOS MFN Standard Metal Gate CMOS SAT 0.4µm Silicon Gate CMOS SAT 0.8µm Silicon Gate CMOS w/memory SAT 1.2µm Silicon Gate CMOS SVL 0.4µm Silicon Gate CMOS SVL 0.6µm Silicon Gate CMOS SVL 0.8µm Silicon Gate CMOS SVL 1.2µm Silicon Gate CMOS SVL SiGe HBT 0.35µm CMOS TSMC 0.18µm Silicon Gate CMOS TSMC 0.35µm Silicon Gate CMOS TSMC 0.5µm Silicon Gate CMOS Assembly Reliability BGA Module Cartridge CSBGA CSP Dongle Flip Chip iButton LGA LQFP Module MQFP PBGA PDIP PLCC Power Cap QFN QSOP SC70 SipStik SOIC SOT SSOP TO TQFP TSOC TSSOP µSOP See Process Reliability Report Index, by Product (PDF, 507kB)