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Quality Assurance and Reliability >
Reliability Information
> Monitor Reports |
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Reliability Monitor Program (Q2 1997) |
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- Reliability Monitor Program (RMP) Description
An Overview of the RMP and a detailed Description of the Data Summaries and Stress Tests used in the RMP. References in ( ) below refer to tables and attachments in the hard copy report.
- RMP Sampling Plan
A table (table 1) of products, packages, and assembly sites included in the Monitors. Frequency and sample sizes are also included.
- RMP Process Sampling Plan
A table (table 1A) of vehicles used to monitor Dallas Semiconductor Technologies.
- RMP Stress Tests
Test Plan for Modules, IC's, SipStik's, and Touch Memory (tables 2, 3, 4, and 5).
- Reliability Data (Attachment A)
Single lot summaries from the Sampling Plan. Data included provides details for read points, sample sizes, and failures, as well as, a calculated failure rate/percent defective by stress.
- Reliability Summary Data (Attachment B)
An historical listing of data generated by the RMP for the past year. Data is sorted by technology type for Operating Life and by Assembly Site and Package for remaining stresses.
- Reliability Summary Data (Attachment B - Graphical)
Reliability Performance graphs of Operating Life and Infant Life for the past year.
- Outgoing Quality Summary Data (Attachment D)
Quality Data for the last four quarters.
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