Search Results: Ambient Temperature

Ambient Temperature Sensor에 대한 전기 엔지니어링 용어 ... [Open results in new window]
... 동의어: Ambient Sensor. 참조: " Ambient Temperature Sensor" 관련 애플리케이션
노트 보기; Ambient Temperature; Local Temperature Sensor. ...
korea.maxim-ic.com/glossary/index.cfm/Ac/V/ID/1095/Tm/Ambient-Temperature-Sensor - 20k

Ambient Temperature에 대한 전기 엔지니어링 용어 정의 ... [Open results in new window]
... 정의 부품 주변의 대기 온도 참조: " Ambient Temperature" 관련 애플리케이션
노트 보기; Local Temperature; Local Temperature Sensor. ...
korea.maxim-ic.com/glossary/index.cfm/Ac/V/ID/1094/Tm/Ambient-Temperature - 20k

[PDF] Reliability Report: [Open results in new window]
... Passivation: Summary Data with Chi-Square Distribution Assumed. Stress Ambient
Temperature and Voltage to Field Ambient Temperature And Voltage ... 70 0 TEMP CYCLE ...
korea.maxim-ic.com/reliability/dallas/DE06L.pdf

[PDF] Reliability Report: [Open results in new window]
... Summary Data with Chi-Square Distribution Assumed. Stress Ambient Temperature and
Voltage to Field Ambient Temperature And Voltage ... TEMPERATURE CYCLE ... TEMP CYCLE ...
korea.maxim-ic.com/reliability/dallas/DE06Q.pdf

[PDF] Reliability Report: [Open results in new window]
... Stress Ambient Temperature and Voltage to Field Ambient Temperature And Voltage
Cf: 60% Ea: 0.7 β: 0 ... HOURS TOTALS: 0 TEMPERATURE CYCLE DS12885 ... 77 0 TEMP CYCLE ...
korea.maxim-ic.com/reliability/dallas/D6N.pdf

[PDF] Reliability Report: [Open results in new window]
... Stress Ambient Temperature and Voltage to Field Ambient Temperature And Voltage ... Stress
Ambient Temperature and Voltage to Field Ambient Temperature And Voltage ...
korea.maxim-ic.com/reliability/dallas/D6H&D6S.pdf

[PDF] Dallas Semiconductor Reliability Report: [Open results in new window]
... Stress Ambient Temperature and Voltage to Field Ambient Temperature And Voltage ... Stress
Ambient Temperature and Voltage to Field Ambient Temperature And Voltage ...
korea.maxim-ic.com/reliability/dallas/DE06C.pdf

[PDF] Assembly Report [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... 80 0 TEMP CYCLE ... TEMPERATURE CYCLE - WAFER LEVEL DESCRIPTION ...
korea.maxim-ic.com/reliability/dallas/Dallas_Backgrind_FC-RDL.pdf

[PDF] E6H Process, Fab 12, 8" Wafer Dallas Semiconductor [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... HRS 0310 1000 125C, 5.25 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0332 ...
korea.maxim-ic.com/reliability/dallas/E6H.pdf

[PDF] E6W Process Reliability Dallas Semiconductor [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... FA# 1000 125C, 5.5 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0335 ...
korea.maxim-ic.com/reliability/dallas/E6W.pdf

[PDF] 8" Wafer Fab Conversion: D6S/D6P Process DS2117M, DS2118M, DS2119M ... [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... DATE CODE 1000 125C, 5.5 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0316 ...
korea.maxim-ic.com/reliability/dallas/E6P_E6S_8in.pdf

[PDF] TSMC 0.25um Embedded FLASH 4-Metal 2.5V/3.3V Process Dallas ... [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... 1000 125C, 3.6V (PSA) & 2.75V (PSB) 45 0 HIGH TEMP OP LIFE HRS ...
korea.maxim-ic.com/reliability/dallas/TSMC_pt25_Flash.pdf

[PDF] TSMC 0.18um Logic Process Phase II Dallas Semiconductor [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... 1000 125C, 3.5V (PSA) & 2.0V (PSB) 45 0 HIGH TEMP OP LIFE HRS ...
korea.maxim-ic.com/reliability/dallas/TSMC_0.18um_LogicII.pdf

[PDF] Process Report [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... HRS 9715 1000 125C, 6.0 VOLTS 80 0 HIGH TEMP OP LIFE HRS 9851 ...
korea.maxim-ic.com/reliability/dallas/D8X.pdf

[PDF] Chartered 0.3um Process Dallas Semiconductor [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... HRS 0234 1000 125C, 3.5 VOLTS 45 0 HIGH TEMP OP LIFE HRS 0317 ...
korea.maxim-ic.com/reliability/dallas/Chartered_DQ03H.pdf

[PDF] Process Report [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... FA# 1000 125C, 6.0 VOLTS 77 0 HIGH TEMP OP LIFE HRS 0345 ...
korea.maxim-ic.com/reliability/dallas/E6ES.pdf

[PDF] Process Report [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... 0126 0 Total: TEMPERATURE CYCLE DESCRIPTION ... 80 0 TEMP CYCLE CYS ...
korea.maxim-ic.com/reliability/dallas/SR06.pdf

[PDF] SE06 Process Reliability Dallas Semiconductor [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... HRS 0147 1000 125C, 5.5 VOLTS 64 0 HIGH TEMP OP LIFE HRS 0412 ...
korea.maxim-ic.com/reliability/dallas/SE06.pdf

[PDF] NRL, BCB, RDL (Underfill/Glob Top) Dallas Semiconductor [Open results in new window]
... All deratings will be done from the stress ambient temperature to the use ambient
temperature. ... DATE CODE 1000 125C, 5.25 VOLTS 45 0 HIGH TEMP OP LIFE HRS 0334 ...
korea.maxim-ic.com/reliability/dallas/Bump_NRL_RDL.pdf