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Maxim >
EMMI
> Material Test Data Files
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Material Test Data Files
Packing Materials
Material Test Data for Flip Chip Devices
Material Test Data for Sputtering Targets
Material Test Data for BCB Materials
Material Test Data for Branding Inks
- INK MARKEM 4488 Black "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated terphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), select Azo, Mirex, Tetrabromobisphenol A Bis (TBBP-A)" July 18, 2007 CE/2007/72436 SGS
(PDF, 364kB)
Material Test Data for Leadframes
- LEADFRAMES LG MICRON (FOR AMKOR) Cu C194 "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated terphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), select Azo, Mirex, Tetrabromobisphenol A Bis (TBBP-A ), Polyvinyl chloride (PVC)" November 16, 2007 KA/2007/B0623 SGS
(PDF, 728kB)
- LEADFRAMES LG MICRON (FOR AMKOR) Cu C7025 "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Polychlorinated biphenyls (PCB), Polychlorinated terphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), Tributyl tin oxide (TBTO), select Azo, Mirex, Tetrabromobisphenol A Bis (TBBP-A ), Polyvinyl chloride (PVC), Asbestos" November 16, 2007 KA/2007/B0622 SGS
(PDF, 719kB)
- LEADFRAMES SUMIKO (FOR AMKOR) Cu A194 "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated terphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), select Azo, Mirex, Tetrabromobisphenol A Bis (TBBP-A ), Arsenic (As), Selenium (Se), Bismuth (Bi), Beryllium (Be), Polyvinyl chloride (PVC), select Phthalates, select Perfluorocarbons (PFC), select Chlorinated Fluorocarbons (CFC), select Halons, select HCFC, select HBFC" February 2, 2008 CA/2007/C2818R3 SGS
(PDF, 2012kB)
- LEADFRAMES SUMIKO (FOR AMKOR) Cu C7025 w/Ag spot plate "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated terphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), select Phthalates, select Azo, Mirex, Arsenic (As), Beryllium (Be), Bismuth (Bi), Selenium (Se), Tetrabromobisphenol A Bis (TBBP-A ), Polyvinyl chloride (PVC), select Perfluorocarbons (PFC), select Chlorinated Fluorocarbons (CFC), select Halons, select HCFC, select HBFC" February 12, 2008 KA/2007/C2817R3 SGS
(PDF, 1992kB)
- LEADFRAMES SUMIKO (FOR AMKOR) EFTEC64T w/Ag spot plate "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated terphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), select Phthalates, select Azo, Mirex, Arsenic (As), Beryllium (Be), Bismuth (Bi), Selenium (Se), Tetrabromobisphenol A Bis (TBBP-A ), Polyvinyl chloride (PVC), select Perfluorocarbons (PFC), select Chlorinated Fluorocarbons (CFC), select Halons, select HCFC, select HBFC" February 12, 2008 KA/2007/C2822R3 SGS
(PDF, 1993kB)
Material Test Data for Die Attach
Material Test Data for Bond/Bump Wire
- HERAEUS (FOR AMKOR) GOLD (Au) BOND WIRE TYPES HA3, HA5, HA6, HA9, H10
"TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs)" January 22, 2008 LF-CTSQYA08_01753 SGS
(PDF, 55kB)
- HEREAUS (FOR AMKOR) Au wire, multiple types "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated triphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), Azo, Mirex, Tetrabromobisphenol A (TBBP-A )" July 13, 2007 F690501/LF-CTSAYA0-1545 2 SGS
(PDF, 645kB)
- MKE (FOR AMKOR) Au wire Type 4N
"TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated Napthalenes (PCN), Polyvinyl Chloride (PVC), Tributyl Tin (TBT), Triphenyl Tin (TPT), Azo, Mirex, Tetrabromobisphenol A (TBBP-A ), Select Phathalates, Select HydroFluoroCarbons (HFC), Select PerFluoroCarbons (PFC), Beryllium (Be), Cesium (Ce), Thallium (Th), Uranium (U), Strontium (Sr)" January 15, 2008 CE/2008/11713A SGS
(PDF, 268kB)
Material Test Data for Molding Compound
- NITTO DENKO GE-100 Series TEST DATA FOR PPM/WT CONTENT OF Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Phosphorous (P) November 16, 2007 CE/2007/B2303 SGS
NITTO DENKO GE-100 Series
"TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs)" November 19, 2007 LPCI/22172/07 SGS
(PDF, 143kB)
Material Test Data for Surface Finish
- PLATING ROHM & HAAS (FOR AMKOR) SOLDERON ST-380 ACID HC, SOLDERON ST-380 ANTI-OXIDANT, SOLDERON ST-380 PRIMARY, SOLDERON ST-380 SECONDARY, SOLDERON TIN CONCENTRATE TEST DATA FOR PPM/WT CONTENT OF: Cadmium (Cd), Hexavalent Chromium (CrVI), Lead (Pb), Mercury (Hg), Polybrominated biphenyl (PBB), Polybrominated diphenyl ether (PBDE) December 12, 2007 EC407642601 SGS
(PDF, 245kB)
- PLATING ROHM & HAAS (FOR AMKOR) SOLDERON ST-380 ANTI-OXIDANT, SOLDERON ST-380 PRIMARY, SOLDERON ST-380 SECONDARY SUPPLIER DOCUMENT STATEMENT FOR CONTENT OF SUBSTANCES: Antimony (Sb), Arsenic (As), Asbestos, Azo, Berylllium (Be), Bismuth (Bi), Bromoniated Flame Retardants other than PBB/PBDE/TBBPA, Cadmium (Cd), Chlorodiphenylmethanem Dichloroethyle, Trichloromethane, Pentachloroethane, Tetrachloromethane, Aliphatic Chlorinated Hydrocarbons (other than PCN/PCB/PCT/SCCP), Short Chain Chlorinated Paraffins (SCCP), Bromodiphenylmethane, Expanded Polystyrene (EPS), Fromaldehyde, Ugilec 121, Ugilec 141, DBBT, Halons, Chlorinated Flurocarbons, HCFC, HBFC, Carbon Tetrachloride, Hydro Fluoro Carbons, Per Fluoro Carbons, Hexavelent Chromium, Lead (Pb), Mercury (Hg), Natural rubber, Nickel (Ni), Palladium, Penta Chloro Phenol (PCP), Perfluorooctane sulfonates (PFOS), Phthalates (DEHP, DBP, DINP, DINP, DNOP, DNHP), Polybrominated Biphenyls (PBB), Polybrominated Diphenlethers (PBDE, PBDO, PBBE, DBDPE, DBDPO), Polychlorinate dBiphenyls (PCB), Polychlorinate terphenyls PCT), Polychlorinated Napthalenes (PCN) Polycyclic Aromatic Hydrocarbons (PAH), Polyvinyl Chloride (PVC), Radioactive substances, Red Phosphorus, Selenium (Se), Tetrabromo bis phenol A (TBBP-A), Tributyltin (TBT), Tributyltin Oxide (TBTO), Triphenlytin (TPT) April 4, 2008
(PDF, 194kB)
Material Test Data for IC Silicon Chip Components
- MAXIM Fabricated wafer (using PFOS containing developer) "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Perfluorooctane sulfonates (PFOS), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I)" June 19, 2008 CE/2008/62379A SGS
(PDF, 342kB)
Material Test Data for Solder Balls
End Products
Supplier Declarations for Hazardous Substances
ISO 17025 Certificates for Material Testing Labs
Material Test Data for Die Lamination Film
Material Test Data for PCB Substrates
- HITACHI (FOR AMKOR) Laminate/Pre-preg types MCL-E-679FGB, MCL-E-679FG, MCL-E679FGB(R), MCL-E-679FG(R), MCL-E-679FG(S), MCL-679FBG(S), GEA-679FG, GEA-679FG(R), GEA-679FG(S), MCL-E679GT, GEA-679GT
"TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs), Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Antimony (Sb), Formaldehyde, Short Chain Chlorinated Paraffins (SCCP 10-13), Asbestos, Polychlorinated biphenyls (PCB), Polychlorinated triphenyls (PCT), Polychlorinated Napthalenes (PCN), Tributyl Tin (TBT), Triphenyl Tin (TPT), Tributyl tin oxide (TBTO), select Azo, Mirex, Tetrabromobisphenol A Bis (TBBP-A ), Arsenic (As), Selenium (Se), Bismuth (Bi), Beryllium (Be), Polyvinyl chloride (PVC), Ethylene glycol ether, select Phthalates" May 30, 2007 CE/2007/55624 SGS
(PDF, 193kB)
- MITISUBISHI (FOR AMKOR) CCL-HL832 Core
SUPPLIER DOCUMENT STATEMENT FOR NON USE OF SUBSTANCES: Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Tetrabromobisphenol A (TBBP-A ), Antimony and it's compounds, Tributyl tin (TBT), Tributyl tin oxide (TBTO), Polyvinyl chloride (PVC), other Brominated Flame Retardants July 19, 2007 N/A N/A
(PDF, 73kB)
- MITISUBISHI (FOR AMKOR) Substrate core types CCL-H, HL830, 832 (without Cu foil), GHPL-830, 832
"TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs)" October 23, 2007 JP/2007/100432 SGS
(PDF, 288kB)
- SUBSTRATE MITISUBISHI (FOR AMKOR) Core Types CCL-H, HL830NX, 832NX (w/o Cu foil), GHPL-830NX, 832NH "TEST DATA FOR PPM/WT CONTENT OF Cadium (Cd), Lead (Pb), Mercury (Hg), Hexavalent Chromium (Cr VI), Polybrominated
biphenyls (PBBs) and Polybrominated biphenyl ethers (PBDEs)" October 23, 2007 JP/2007/100435 SGS
(PDF, 331kB)
- TAIYO (FOR AMKOR) PSR-4000 AUS308/CA-40 AUS308, PSR-4000 AUS320/CA-40 AUS320 SOLDER MASK
SUPPLIER DOCUMENT STATEMENT FOR NON USE OF SUBSTANCES: Bromine (Br), Chlorine (Cl), Flourine (F), Iodine (I), Tetrabromobisphenol A (TBBP-A ), Antimony and it's compounds, Tributyl tin (TBT), Tributyl tin oxide (TBTO), Polyvinyl chloride (PVC), other Brominated Flame Retardants June 18, 2007 N/A N/A
(PDF, 46kB)
Material Test Data for Specific Products
Material Test Data for Underfill
Material Test Data for Coatings
Material Test Data for Redistribution Layer
Material Test Data for Liquid Encapsulants
Material Test Data for Flux
Material Test Data for Solder Paste
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