MAX9957

Fast Dual Driver for ATE with Waveform Shaping

DDR2 Memory Testers, GDDR3, and GDDR4 for ATE Applications Requiring 2Gbps Performance and Waveform Fidelity Control

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Status Explanations for product status codes

Part Number Status
MAX9957 Active: In Production. But some versions of the family are Not Recommended for New Designs. See Ordering Information.

Description

The MAX9957 dual driver IC for automatic test equipment (ATE) memory applications offers three-level drive capability, high-speed switching, low timing dispersion, and features voltage-controlled waveform shaping to enhance edge-placement accuracy and minimize distortion. It also provides tight matching of gain and offset. The MAX9957 buffers reference voltage inputs for each channel with nominal -1V to +3.5V voltage ranges. High-speed differential control inputs, compatible with CML levels, are provided for each channel. Static power dissipation is only 1500mW per channel with nominal -5V and +7V supplies. The MAX9957 power dissipation at 2Gbps toggling is only 1550mW/channel. The MAX9957D power dissipation at 2.4Gbps is only 1850mW/channel.

The MAX9957 is available in a 10mm x 10mm x 1mm, 64-pin TQFP package with an exposed pad, inverted die pad for ease of heat removal.
 

Data Sheet

NOTE: This product uses the following:
9955_9957R10.zip

Key Features

  • Terminator/3-Level Driver
  • 2Gbps Toggling at 2VP-P (MAX9957)
  • 2.4Gbps Toggling at 2VP-P (MAX9957D)
  • Voltage-Controlled Waveform Shaping
  • Interfaces Easily With Most Logic Families
  • Low Timing Dispersion
 

Applications/Uses

  • Automatic Test Equipment: DDR2 Memory Testers, GDDR3, GDDR4
   

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Information Index

Document Ref.: 19-0861 Rev 1; 2010-05-19
This page last modified: 2010-05-19




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