DS2172

Bit Error Rate Tester (BERT)

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Status Explanations for product status codes

Active: In Production.

Description

The DS2172 Bit Error Rate Tester (BERT) is a software-programmable test pattern generator, receiver, and analyzer capable of meeting the most stringent error performance requirements of digital transmission facilities. Two categories of test pattern generation (pseudorandom and repetitive) conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS2172 operates at clock rates ranging from DC to 52MHz. This wide range of operating frequency allows the DS2172 to be used in existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs, routers, bridges, CSUs, DSUs, and CPE equipment.

The DS2172 user-programmable pattern registers provide the unique ability to generate loopback patterns required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence, the DS2172 can initiate the loopback, run the test, check for errors, and finally deactivate the loopback.

The DS2172 consists of four functional blocks: the pattern generator, pattern detector, error counter, and control interface. The DS2172 can be programmed to generate any pseudorandom pattern with length up to 232-1 bits (see table 5, note 9 in data sheet) or any user-programmable bit pattern from 1 to 32 bits in length. Logic inputs can be used to configure the DS2172 for applications requiring gap clocking such as Fractional-T1, Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the DS2172 can insert single or 10-1 to 10-7 bit errors to verify equipment operation and connectivity.
 

Data Sheet

Download this datasheet in PDF formatDownload Rev 1 (PDF, 184kB)
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Key Features

  • Generates/detects digital bit patterns for analyzing, evaluating, and troubleshooting digital communications systems
  • Operates at speeds from DC to 52MHz
  • Programmable polynomial length and feedback taps for generation of any other pseudorandom pattern up to 32 bits in length including: 26-1, 29-1, 211-1, 215-1, 220-1, 223-1, and 232-1
  • Programmable user-defined pattern and length for generation of any repetitive pattern up to 32 bits in length
  • Large 32-bit error count and bit count registers
  • Software-programmable bit-error insertion
  • Fully independent transmit and receive sections
  • 8-bit parallel control port
  • Detects test patterns with bit error rates up to 10-2
   
   

Key Specifications:

T/E Carrier & Packetized Products
Part Number Functions Channels VSUPPLY
(V)
Package/Pins Smallest Available Pckg.
(mm2)
Budgetary Price
max w/pins See Notes
DS2172  Bit Error-Rate Tester 1 5
TQFP/32
84.6 $6.98 @1k
See All T/E Carrier & Packetized Products (100)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific prices and delivery, please see the price and availability page or contact an authorized distributor.


Diagram

DS2172: Functional Block Diagram
Functional Block Diagram

Application Notes

Application Note 332   DS2172 Simplified Receiver Operation
Application Note 333   DS2172 Pattern Synchronization
Application Note 334   DS2172 BERT Interface to all Dallas Framers and Transceivers
Application Note 375   Interfacing User Devices and the DST1E1DK SCT Design Kit
Application Note 2706   Bit Error Rate Testing the DS314x Series of DS3/E3 Framers

Product Guides

Communications (PDF)

Reliability Reports

Reliability Report: DS2172.pdf

Software/Models

DS2172 IBIS Model

Ordering Information

Filters: Part Number: Package: Temperature: Tape and Reel Sample
Part Number Free
Sample
Buy Status Explanations for product status codes Package:
TYPE PINS FOOTPRINT
DRAWING  CODE/VAR *
Temp RoHS/Lead-Free?
Materials Analysis
DS2172T    
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32-3*
0°C to +70°C RoHS/Lead-Free: No
Materials Analysis
DS2172T+  
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32+3*
0°C to +70°C RoHS/Lead-Free: Lead Free
Materials Analysis
DS2172T+T&R    
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32+3*
0°C to +70°C RoHS/Lead-Free: Lead Free
Materials Analysis
DS2172T/T&R    
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32-3*
0°C to +70°C RoHS/Lead-Free: No
Materials Analysis
DS2172TN    
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32-3*
-40°C to +85°C RoHS/Lead-Free: No
Materials Analysis
DS2172TN+  
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32+3*
-40°C to +85°C RoHS/Lead-Free: Lead Free
Materials Analysis
DS2172TN+T&R    
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32+3*
-40°C to +85°C RoHS/Lead-Free: Lead Free
Materials Analysis
DS2172TN/T&R    
Active TQFP;32 pin;84.6 mm²
Outline Drawing:21-0292 (PDF)
Land Pattern: 90-0297 (PDF)
Use pkgcode/variation: C32-3*
-40°C to +85°C RoHS/Lead-Free: No
Materials Analysis

Notes:
  1. Other options and links for purchasing parts are listed at: http://www.maxim-ic.com/sales.
  2. Didn't Find What You Need? Ask our applications engineers. Expert assistance in finding parts, usually within one business day.
  3. Part number suffixes: T or T&R = tape and reel; + = RoHS/lead-free; # = RoHS/lead-exempt; -D = drypack; -U/+U on DS parts = cut tape. More: See Full Data Sheet or Maxim Product Naming Conventions.
  4. * Some packages have variations, listed on the drawing. "PkgCode/Variation" tells which variation the product uses. Note that "+", "#", "-" in the part number suffix describes RoHS status. Package drawings may show a different suffix character.

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Rev 1; 2000-10-10
This page last modified: 2009-10-22


 


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